產(chǎn)品名稱：
邏輯分析儀探頭| P6410
更新時(shí)間：2025-08-31
產(chǎn)品型號(hào)：P6410
產(chǎn)品報(bào)價(jià)：
產(chǎn)品特點(diǎn)：邏輯分析儀探頭| P6410For differential signaling applications where signal integrity is critical, the high-fidelity P6980 and P6982 are perfect for those applications where noise performance is critical. In a
P6410邏輯分析儀探頭| P6410的詳細(xì)資料：
邏輯分析儀探頭| P6410邏輯分析儀探頭| P6410
Features & Benefits
- <0.7 pF Total Capacitive Loading Minimizes Intrusion on Circuits
- 20 k? Input Resistance
- 6.5 Vp-p Dynamic Range Supports a Broad Range of Logic Families
- General-purpose Probing Allows Flexible Attachment to Industry-standard Connections
- Connectorless Probing System Eliminates Need for Onboard Connectors
Applications
- Hardware Debug and Verification
- Processor/Bus Debug and Verification
- Embedded Software Integration, Debug, and Verification
Leading Probing Solutions for Real-time Digital Systems Analysis
P6400 Series Probes
No test and measurement solution is complete without probing and the consideration of its impact on your system and your measurement time. With the industry’s lowest probe loading, the P6400 Series logic analyzer probes protect the integrity of your signal – minimizing the impact on your design. The P6400 Series logic analyzer probes when used with the TLA5000 Series logic analyzers make sophisticated logic analysis available at an affordable price. Select from a variety of attachment mechanisms, including the high-density D-Max® Probing Technology that eliminates the need for onboard connectors.
- For applications where circuit board space is limited, the high-density P6450 offers the smallest available footprint and a quick connection mechanism.
- With low loading capacitance, the P6400 Series can accuray acquire signals with faster edges without distorting the signal.
- Flexible general-purpose probing, with support for 0.100 in. and 2 mm pin spacing, low input capacitance, and accessories for connecting to many industry-standard connections.
P6800 and P6900 Series Probes
With the industry’s lowest capacitance, the P6800 and P6900 Series logic analyzer probes for the TLA7000 Series protect the integrity of your signal – critical for connecting to fast buses like DDR2 and DDR3 where low intrusion is key to the proper operation of your design. Select from single-ended and differential probes and a variety of attachment mechanisms, including the “connectorless” compression connection that eliminates the need for onboard connectors.
For applications where circuit board space is at a premium, the high-density P6900 Series with D-Max® Probing Technology offers the industry’s smallest available footprint. For debugging the signal integrity glitches common on fast buses, the P6900 Series works with the TLA7Bxx and TLA7ACx modules and their iLink™ Tool Set capability to provide iCapture™ simultaneous digital-analog acquisition. This allows you to clearly see the time-correlated digital and analog behavior of your design, without the extra capacitance and setup time of double probing.
For differential signaling applications where signal integrity is critical, the high-fidelity P6980 and P6982 are perfect for those applications where noise performance is critical. In addition, the P6980 and P6982 can support the small voltage swings that differential signaling often requires. The P6962DBL, when used with a TLA7000 logic analyzer with the TLA7Bxx module, supports digital validation and debug of DDR3 memory with data rates up to 1600 mega-transfers per second. For board designs that do not include high-density probe footprints, the P6960 with its companion flying leadset or the P6810 provide the flexibility required to meet many different debug needs.
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